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ANSI/GEIA STD-0008-2011电子元件降额标准

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德凯宜特
TechAmerica Standard
Derating of Electronic Components
GEIA-STD-0008
Initial Release Aug 2011

Contents
Acknowledgements ... i
Foreword .... i
1 PURPOSE ..... 1
1.1 Definitions ...... 1
1.2 Scope ...... 1
1.3 Use of this Standard ..... 1
1.4 Components not addressed in this standard ... 1
2 REFERENCE DOCUMENTS ..... 2
3 REQUIREMENTS . 2
Tables
1 Integrated Circuits . 3
2 Semiconductors .... 4
3 Optoelectronics ..... 6
4 Resistors . 7
5 Capacitors ...... 8
6 Magnetics 9
7 Fuses .... 10
8 Contacts (switches/relays) . 11
9 Connectors, Wire, and Cable .... 12

1 PURPOSE
This document is generated to provide an industry standard for derating of electronic components. For the purposes of this document, the following definitions apply:
1.1 Definitions
Controlled/Uncontrolled – See paragraph 3 herein.
Derate – To reduce the rating(s) of a component to improve its reliability or to permit operation at high ambient temperatures.
Derating – The reduction in rating of a component.
Derating limits – The maximum nominal stresses that a component is allowed to experience in an application. The Derating Limits are always less than the component’s rated maximum stresses.
 
1.2 Scope
This Standard specifies the minimum derating requirements for using electronic components in moderately severe environments. These environments are assumed to include Airborne Inhabited Cargo (AIC), Airborne Inhabited Fighter (AIF), Ground Mobile (GM), and Naval Sheltered (NS) environments specified in MIL-HDBK-217. This Standard is intended to supersede the derating limits contained in Defense Standardization Program Office (DSPO) Standardization Directive SD-18, Naval Standard TE000-AB-GTP-010, and Air Force ESD-TR-85-148. It is intended that a future revision of this Standard will include additional requirements for derating for other environments (e.g. Airborne Uninhabited Cargo). Since this Standard specifies the minimum derating requirements, (sub)contractors may derate in excess of these requirements. This Standard is not intended for use in space or launch system applications, which have their own existing derating standards, and shall not be used for such applications unless specifically allowed by contract.
1.3 Use of this Standard
It is intended that this Standard be called out in contractual documents, and that the call-out specify what to do in case the derating limits herein cannot be met in certain cases.
1.3.1 Sample contract language:
“The (sub)contractor shall derate electronic components in accordance with GEIA-STD-0008. In the event the (sub)contractor intends to exceed a derating limit, the (sub)contractor shall obtain customer approval of that exception.”
NOTE: JEP149 may be used as the basis of the engineering evaluations, which include the component supplier in determining alternate derating criteria that will meet the application reliability requirements. The customer may want to grant blanket approval of all derating exceptions that are successfully addressed by JEP149 engineering evaluations.
1.4 Components not addressed in this standard
When a component is being used that is not addressed by this standard, the user is strongly encouraged to contact the appropriate TechAmerica chairperson (G-12 Chair for solid state components, G-11 Chair for passive components) from the www.techamerica.org website (under “Committees”, “Systems Standards and Technology Committee” for determination of a value to be used and included in the next revision of this Standard.

2 REFERENCE DOCUMENTS
MILITARY
SD-18 Part Requirement and Application Guide
MIL-HDBK-217 Reliability Prediction of Electronic Equipment
TE000-AB-GTP-010 Part Derating Requirements and Application Manual for Navy Electronic Equipment
ESD-TR-85-148 Derated Application of Parts for ESD Systems Development
TechAmerica
GEIA-STD-0001 Aerospace Qualified Electronic Components, Volume 1: Integrated
Circuits and Semiconductors
INDUSTRY
Automotive Electronics Council
Q100 Stress Qualification For Integrated Circuits
Q101 Stress Test Qualification For Discrete Semiconductors
Q200 Stress Test Qualification For Passive Components
JEDEC
JEP149 Application Thermal Derating Methodologies
Society of Automotive Engineers
AS 50881 Wiring Aerospace Vehicle
 
3 REQUIREMENTS
Components shall be derated in accordance with the Tables herein so that the stresses the component experiences in the application shall not exceed the limits specified. Military specification components, automotive grade components qualified in accordance with AEC Q100 (or AEC Q101, or Q200, as appropriate), or AQEC components qualified in accordance with GEIA-STD-0001 shall be derated in accordance with the limits under the “Controlled” column in the Tables. All other components shall be derated in accordance with the limits in the “Uncontrolled” column of the Tables. Hybrids shall not be derated, but analysis of the individual elements within the hybrid may use the information in the Tables herein for guidance. Monolithic Microwave Integrated Circuits (MMICs) shall be derated in accordance
with the part listed herein they are the most similar to.

原文附件下载:ANSI/GEIA STD-0008-2012电子元件降额标准

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