加速测试模型大全

manch · 发表于 2011-5-29 16:01:50

加速测试模型大全

admin · 发表于 2011-5-29 23:26:52

SemiconductorDeviceReliabilityFailureModels

Abstract:Noabstract.
Keywords:ReliabilityModeling,FailureMechanisms,Electromigration,Corrosion,StressMigration
Authors:RichardBlish,NoelDurrant

TableofContents
Objectives,ScopeandExplanationofSymbols3
A.ELECTROMIGRATION.4
B.CORROSION.7
C.TIMEDEPENDANTDIELECTRICBREAKDOWN9
D.HOTCARRIERINJECTION12
E.SURFACEINVERSION(MobileIons).14
F.STRESSMIGRATION.16
G.TEMPERATURECYCLING&THERMALSHOCK19
H.SOFTERRORS(SingleEventUpsets).22
I.DesignofExperimentsforDeterminationofModelingParameters.24
J.Time-To-FailureDistributions.25

安德维京 · 发表于 2011-5-30 09:33:45

Abstract:Thisreviewpaperbringstogetherthemostprevalentandimportantmodelsforreliabilityfailuresinsemiconductordevices.Itgivesaexplanationofthefailure,thefailuremodel(s)andconstraintsofthemodels.Examplesarepresentedshowingtheapplicationofthemodelsforderivingaccelerationfactors.Originalreferencesareincludedforeachmodel.

帮admin老大补上abstract

谢谢楼主，好东东！

Allen_jje · 发表于 2011-5-30 17:06:30

谢谢分享！

pif2216 · 发表于 2011-5-30 18:54:14

不错！

wlbvine123 · 发表于 2011-6-9 16:06:25

水平有限，看不懂，能不能搞点中文的上来

namixiaoxin · 发表于 2011-6-18 01:38:01

好像主要是wafer级的加速度模型，这个公司的资料确实不错
谢谢楼主了

amw_2738 · 发表于 2011-6-18 11:37:22

不错，谢谢

77thb · 发表于 2011-6-30 09:34:42

谢谢分享

		自动登录	找回密码
密码			-注册-

加速测试模型大全

本帖子中包含更多资源

评分

浏览过的版块