半导体器件可靠性预估
没有找到MIL-HDBK-217的可以看看这个资料，但我也不知道这是从哪个标准里截取下来的，有哪位高手可以指点一下？RELIABILITYPREDICTIONOFSEMICONDUCTORDEVICES
1.INTRODUCTION
Whensemiconductordevicesareusedinelectronicequipmentandsystems,thepredictionofthereliability(failurerate)ofthesesemiconductordevicesisextremelyimportantinreliabilitydesignandintegritydesign.
Thefailurerateofsemiconductordevices,whichisaffectedbyinherentreliabilitybasedondesign,manufacturing,andqualitycontrolsystems,isalsoinfluencedbyoperationalconditionsorenvironmentalconditions.Factorsinfluencingthereliabilityofsemiconductordevicesareclassifiedintotwomajorgroups,onebasedonthemanufactureandtheotherontheuser.
Thesefactorscanbefurthersubdividedintosubgroups,whicharenotindependentofoneanotherbutinteractive.Reliabilityisthereforetheresultofthesefactorsmultipliedbyoneanother1).
Asitisimpossibletodeterminetheoreticallythefactorsforpredictingreliability,predictionequationsareconstructedfromactualfielddata.
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