The measurements specified in the applicable life test specification shall be made initially, at the end of each interim period, and at the conclusion of the life test. Interim and final measurements may include high temperature testing. However, testing at elevated temperatures shall only be performed after completion of specified room (and lower) temperature test measurements. After interim testing, bias shall be applied to the parts before heat is applied to the chamber, or within ten minutes of loading the final parts into a hot chamber. Electrical testing shall be completed as soon as possible after removal of bias from devices and no longer than 96 hours for high voltage devices (defined as > 10 volts) or 168 hours for all other devices. If the availability of test equipment or other factors make meeting this requirement difficult, bias must be maintained on the devices; this may be either at the stress temperature or room temperature and the bias may be reduced to nominal voltage from any accelerated voltage in use for stress. . If the devices have been removed from bias and the time window is exceeded, the stress must be resumed for the duration specified in Table 1 prior to completion of the measurements. After an interim measurement, the stress shall be continued from the point of interruption. The time window and the high temperature testing restrictions of this clause need not be met if verification data for a given technology is provided.