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Reliabilitygrowthtestinginvolvestheselectionofoptimaldesignparameterstoenhanceaproduct’sreliability.This paperproposesasplitplotexperimentaldesignthataccommodatestherestrictiononrandomizationontheorderofexperimentalrunscausedbytheexperimentalnatureofacceleratedreliabilitytesting.Theproposedexperimental designprovidesstatisticallyrelevantsolutionsaboutthechoiceofdesignparameters,intermsoftheirreliabilityimpact, inamuchshortertime.Adegradationmodelthataidsinpredictingthefailuretimeforthegivenproblemfurther supplementsthisdiscussion.
Reliability enhancement of electronic packages
chjhwfj
Lv.2
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Reliability enhancement of electronic packages by design of optimal parameters.pdf
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